7 search results - page 2 / 2 » Static noise analysis for digital integrated circuits in par... |
DAC
2010
ACM
13 years 9 months ago
2010
ACM
The level of security provided by digital rights management functions and cryptographic protocols depend heavily on the security of an embedded secret key. The current practice of...
DAC
2007
ACM
14 years 6 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...