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VLSI
2007
Springer
13 years 11 months ago
Parametric structure-preserving model order reduction
Abstract—Analysis and verification environments for nextgeneration nano-scale RFIC designs must be able to cope with increasing design complexity and to account for new effects,...
Jorge Fernandez Villena, Wil H. A. Schilders, L. M...

Publication
576views
15 years 4 months ago
Within-die Process Variations: How Accurately can They Be Statistically Modeled?
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
Brendan Hargreaves, Henrik Hult, Sherief Reda
ICASSP
2011
IEEE
12 years 8 months ago
Sparse coding and dictionary learning based on the MDL principle
The power of sparse signal coding with learned overcomplete dictionaries has been demonstrated in a variety of applications and fields, from signal processing to statistical infe...
Ignacio Ramírez, Guillermo Sapiro
HICSS
2003
IEEE
179views Biometrics» more  HICSS 2003»
13 years 10 months ago
JUMBL: A Tool for Model-Based Statistical Testing
Statistical testing of software based on a usage model is a cost-effective and efficient means to make inferences about software quality. In order to apply this method, a usage m...
Stacy J. Prowell
CORR
2007
Springer
140views Education» more  CORR 2007»
13 years 5 months ago
From the entropy to the statistical structure of spike trains
— We use statistical estimates of the entropy rate of spike train data in order to make inferences about the underlying structure of the spike train itself. We first examine a n...
Yun Gao, Ioannis Kontoyiannis, Elie Bienenstock