44 search results - page 3 / 9 » Statistical approach in a system level methodology to deal w... |
ATS
2010
IEEE
13 years 3 months ago
2010
IEEE
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...
FDL
2004
IEEE
13 years 9 months ago
2004
IEEE
Reconfigurability is becoming an important part of System-on-Chip (SoC) design to cope with the increasing demands for simultaneous flexibility and computational power. Current ha...
VLSID
2006
IEEE
14 years 5 months ago
2006
IEEE
SoC design methodologies are under constant revision due to adoption of fast shrinking process technologies at nanometer levels. Nanometer process geometries exhibit new complex d...
ICCAD
2006
IEEE
14 years 2 months ago
2006
IEEE
Process variations in modern VLSI technologies are growing in both magnitude and dimensionality. To assess performance variability, complex simulation and performance models param...
DT
2006
13 years 5 months ago
2006
process: Designers must define higher abstraction levels that allow system modeling. They must use description languages that handle both hardware and software components to descri...