32 search results - page 1 / 7 » Statistical identification and analysis of defect developmen... |
DPHOTO
2009
13 years 2 months ago
2009
The lifetime of solid-state image sensors is limited by the appearance of defects, particularly hot-pixels, which we have previously shown to develop continuously over the sensor ...
DFT
2007
IEEE
13 years 11 months ago
2007
IEEE
Growth of pixel density and sensor array size increases the likelihood of developing in-field pixel defects. An ongoing study on defect development in imagers has now provided us ...
MVA
2000
13 years 6 months ago
2000
The present paper proposes a new concept of image processing method based on vector representation for visual inspection test. The method was applied to detect defects and extract...
TIFS
2008
13 years 4 months ago
2008
The various image-processing stages in a digital camera pipeline leave telltale footprints, which can be exploited as forensic signatures. These footprints consist of pixel defects...
CIMAGING
2008
13 years 6 months ago
2008
We apply stabilized inverse diffusion equations (SIDEs) to segment microscopy images of materials to aid in analysis of defects. We extend SIDE segmentation methods and demonstrat...