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ISBI
2007
IEEE
13 years 11 months ago
Statistically-Constrained Deformable Registration of Mr Brain Images
Statistical models of deformations (SMD) capture the variability of deformations of a group of sample images, and they are often used to constrain deformable registration, thereby...
Zhong Xue, Dinggang Shen
TIP
2002
133views more  TIP 2002»
13 years 5 months ago
A joint inter- and intrascale statistical model for Bayesian wavelet based image denoising
Abstract--This paper presents a new wavelet-based image denoising method, which extends a recently emerged "geometrical" Bayesian framework. The new method combines three...
Aleksandra Pizurica, Wilfried Philips, Ignace Lema...
ICIP
2010
IEEE
13 years 3 months ago
Adaptive blotches detection for film restoration
Blotches are very common, localized, and non persistent impairments in digitized film archive. Many methods have been proposed so far for detecting them and restoring the underlyi...
Antoni Buades, Julie Delon, Yann Gousseau, Simon M...
ICIP
2005
IEEE
14 years 7 months ago
Texture-adaptive mother wavelet selection for texture analysis
Classification results obtained using wavelet-based texture analysis techniques vary with the choice of mother wavelet used in the methodology. We discuss the use of mother wavele...
G. Charith K. Abhayaratne, Ian H. Jermyn, Josiane ...
ISCAS
2008
IEEE
171views Hardware» more  ISCAS 2008»
13 years 11 months ago
Statistical image modeling using von Mises distribution in the complex directional wavelet domain
— In this paper, a new statistical model is proposed for modeling the nature images in the transform domain. We demonstrate that the von Mises distribution (VM) fits accurately ...
An P. N. Vo, Soontorn Oraintara, Truong T. Nguyen