44 search results - page 7 / 9 » Statistically Robust Design of Linear MIMO Transceivers |
GECCO
2008
Springer
13 years 6 months ago
2008
Springer
This article presents a robust EDA for global optimization with real parameters. The approach is based on the linear combination of individuals of two populations. One is the curr...
DAC
2006
ACM
14 years 6 months ago
2006
ACM
Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...
CVPR
2008
IEEE
14 years 7 months ago
2008
IEEE
In this paper, we describe a nonlinear image representation based on divisive normalization that is designed to match the statistical properties of photographic images, as well as...
DAC
2008
ACM
14 years 6 months ago
2008
ACM
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
ICCAD
2006
IEEE
14 years 2 months ago
2006
IEEE
Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...