34 search results - page 6 / 7 » Stochastic Power Grid Analysis Considering Process Variation... |
ICCAD
2009
IEEE
13 years 3 months ago
2009
IEEE
With increasing process variation, binning has become an important technique to improve the values of fabricated chips, especially in high performance microprocessors where transpa...
ATS
2005
IEEE
13 years 11 months ago
2005
IEEE
—Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...
CORR
2011
Springer
13 years 19 days ago
2011
Springer
Abstract. Consider a weighted and undirected graph, possibly with self-loops, and its corresponding Laplacian matrix, possibly augmented with additional diagonal elements correspon...
IWCIA
2004
Springer
13 years 11 months ago
2004
Springer
We consider selected geometric properties of 2D or 3D sets, given in form of binary digital pictures, and discuss their estimation. The properties examined are perimeter and area i...
ESORICS
2003
Springer
13 years 11 months ago
2003
Springer
Recently, David Chaum proposed an electronic voting scheme that combines visual cryptography and digital processing. It was designed to meet not only mathematical security standard...