3 search results - page 1 / 1 » Table look-up based compact modeling for on-chip interconnec... |
ISCAS
2003
IEEE
13 years 10 months ago
2003
IEEE
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
As technology scales toward deep submicron, on-chip interconnects are becoming more and more sensitive to noise sources such as power supply noise, crosstalk, radiation induced ef...
DAC
2008
ACM
14 years 5 months ago
2008
ACM
Current source based cell models are becoming a necessity for accurate timing and noise analysis at 65nm and below. Voltage waveform shapes are increasingly more difficult to repr...