8 search results - page 1 / 2 » Techniques for Transient Fault Sensitivity Analysis and Redu... |
DFT
2003
IEEE
13 years 10 months ago
2003
IEEE
Transient faults in VLSI circuits could lead to disastrous consequences. With technology scaling, circuits are becoming increasingly vulnerable to transient faults. This papers pr...
ISQED
2002
IEEE
13 years 9 months ago
2002
IEEE
The reliability of ADCs used in highly critical systems can be increased by applying a two-step procedure starting with sensitivity analysis followed by redesign. The sensitivity ...
ICCAD
2008
IEEE
14 years 1 months ago
2008
IEEE
– Due to reduction in device feature size and supply voltage, the sensitivity of digital systems to transient faults is increasing dramatically. As technology scales further, the...
ISCAS
2003
IEEE
13 years 10 months ago
2003
IEEE
High frequency digital LSIs usually consist of many subcircuits coupled with multi-conductor interconnects embedded in the substrate. They sometimes cause serious problems of the ...
ISQED
2007
IEEE
13 years 11 months ago
2007
IEEE
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...