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DAC
2005
ACM
14 years 6 months ago
Advanced Timing Analysis Based on Post-OPC Extraction of Critical Dimensions
While performance specifications are verified before sign-off for a modern nanometer scale design, extensive application of optical proximity correction substantially alters the l...
Puneet Gupta, Andrew B. Kahng, Youngmin Kim, Denni...
ASPDAC
2007
ACM
98views Hardware» more  ASPDAC 2007»
13 years 9 months ago
Node Mergers in the Presence of Don't Cares
Abstract-- SAT sweeping is the process of merging two or more functionally equivalent nodes in a circuit by selecting one of them to represent all the other equivalent nodes. This ...
Stephen Plaza, Kai-Hui Chang, Igor L. Markov, Vale...
DAC
2006
ACM
14 years 6 months ago
Statistical timing based on incomplete probabilistic descriptions of parameter uncertainty
Existing approaches to timing analysis under uncertainty are based on restrictive assumptions. Statistical STA techniques assume that the full probabilistic distribution of parame...
Wei-Shen Wang, Vladik Kreinovich, Michael Orshansk...
ICCAD
2004
IEEE
147views Hardware» more  ICCAD 2004»
14 years 2 months ago
Interval-valued reduced order statistical interconnect modeling
9, IO]. However, unlike the case with static timing, it is not so easy We show how recent advances in the handling of correlated interval representations of range uncertainty can b...
James D. Ma, Rob A. Rutenbar
TC
2008
13 years 5 months ago
Accurate, Pre-RTL Temperature-Aware Design Using a Parameterized, Geometric Thermal Model
Abstract-- Preventing silicon chips from negative, even disastrous thermal hazards has become increasingly challenging these days; considering thermal effects early in the design c...
Wei Huang, Karthik Sankaranarayanan, Kevin Skadron...