Abstract— Reliability enhancements are traditionally implemented through redundancies at the system level or through the use of harden-cell-designs at the circuit level. Reliabil...
As device size shrinks to the nanometer range, FPGAs are increasingly prone to manufacturing defects. We anticipate that the ability to tolerate multiple defects will be very impo...
While circuit density and power efficiency increase with each major advance in IC technology, reliability with respect to soft errors tends to decrease. Current solutions to this...
Smita Krishnaswamy, Stephen Plaza, Igor L. Markov,...
Structuring and mapping of a Boolean function is an important problem in the design of complex integrated circuits. Libraryaware constructive decomposition offers a solution to th...
Each semiconductor technology generation brings us closer to the imminent processor architecture heat wall, with all its associated adverse effects on system performance and reliab...