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DAC
2003
ACM
14 years 6 months ago
A cost-driven lithographic correction methodology based on off-the-shelf sizing tools
As minimum feature sizes continue to shrink, patterned features have become significantly smaller than the wavelength of light used in optical lithography. As a result, the requir...
Puneet Gupta, Andrew B. Kahng, Dennis Sylvester, J...
WWW
2008
ACM
14 years 6 months ago
A differential notion of place for local search
For extracting the characteristics a specific geographic entity, and notably a place, we propose to use dynamic Extreme Tagging Systems in combination with the classic approach of...
Vlad Tanasescu, John Domingue
DSN
2009
IEEE
14 years 1 days ago
Low overhead Soft Error Mitigation techniques for high-performance and aggressive systems
The threat of soft error induced system failure in high performance computing systems has become more prominent, as we adopt ultra-deep submicron process technologies. In this pap...
Naga Durga Prasad Avirneni, Viswanathan Subramania...