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DAC
2003
ACM
14 years 7 months ago
2003
ACM
As minimum feature sizes continue to shrink, patterned features have become significantly smaller than the wavelength of light used in optical lithography. As a result, the requir...
WWW
2008
ACM
14 years 6 months ago
2008
ACM
For extracting the characteristics a specific geographic entity, and notably a place, we propose to use dynamic Extreme Tagging Systems in combination with the classic approach of...
DSN
2009
IEEE
14 years 23 days ago
2009
IEEE
The threat of soft error induced system failure in high performance computing systems has become more prominent, as we adopt ultra-deep submicron process technologies. In this pap...