7 search results - page 2 / 2 » Test Bus Sizing for System-on-a-Chip |
DAC
2009
ACM
13 years 9 months ago
2009
ACM
Process scaling has given designers billions of transistors to work with. As feature sizes near the atomic scale, extensive variation and wearout inevitably make margining unecono...
HICSS
2010
IEEE
13 years 11 months ago
2010
IEEE
Numerous recent papers have found important relationships between network structure and risks within networks. These results indicate that network structure can dramatically affec...