532 search results - page 2 / 107 » Test Data Compression: The System Integrator's Perspective |
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
We present an approach to prevent overtesting in scan-based delay test. The test data is transformed with respect to functional constraints while simultaneously keeping as many po...
SIGMOD
2006
ACM
14 years 5 months ago
2006
ACM
Column-oriented database system architectures invite a reevaluation of how and when data in databases is compressed. Storing data in a column-oriented fashion greatly increases th...
TVLSI
2010
13 years 5 days ago
2010
Abstract--Higher circuit densities in system-on-chip (SOC) designs have led to drastic increase in test data volume. Larger test data size demands not only higher memory requiremen...
ASPDAC
2007
ACM
13 years 9 months ago
2007
ACM
As the large size of test data volume is becoming one of the major problems in testing System-on-a-Chip (SoC), several compression coding schemes have been proposed. Extended frequ...
ASPDAC
2007
ACM
13 years 9 months ago
2007
ACM
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...