1812 search results - page 2 / 363 » Test Early, Test Often |
GECCO
2010
Springer
13 years 10 months ago
2010
Springer
The increase in the complexity of modern software has led to the commensurate growth in the size and execution time of the test suites for these programs. In order to address this...
ECLIPSE
2007
ACM
13 years 9 months ago
2007
ACM
In the software development life cycle, unit testing is an important phase that helps in early detection of bugs. A unit test case consists of two parts: a test input, which is of...
GLVLSI
1999
IEEE
13 years 10 months ago
1999
IEEE
This paper proposes a new fault coverage estimation model which can be used in the early stage of VLSI design. The fault coverage model is an exponentially decaying function with ...
ERLANG
2008
ACM
13 years 7 months ago
2008
ACM
Current and future trends for software include increasingly complex requirements on interaction between systems. As a result, the difficulty of system testing increases. Model-bas...
PATMOS
2000
Springer
13 years 9 months ago
2000
Springer
Abstract. Reduction of chip packaging and cooling costs for deep sub-micron SystemOn-Chip (SOC) designs is an emerging issue. We present a simulation-based methodology able to real...