37 search results - page 3 / 8 » Test Enrichment for Path Delay Faults Using Multiple Sets of... |
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
The first non-enumerative framework for diagnosing path delay faults using zero suppressed binary decision diagrams is introduced. We show that fault free path delay faults with ...
ASPDAC
2004
ACM
13 years 11 months ago
2004
ACM
— This paper presents a SAT-based ATPG tool targeting on a path-oriented transition fault model. Under this fault model, a transition fault is detected through the longest sensit...
ET
2010
13 years 4 months ago
2010
Abstract As technology scales down into the nanometer era, delay testing of modern chips has become more and more important. Tests for the path delay fault model are widely used to...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
: The paper presents a novel technique for generating effective vectors for delay defects. The test set achieves high path delay fault coverage to capture smalldistributed delay de...
VTS
1999
IEEE
13 years 9 months ago
1999
IEEE
This paper presents adaptive techniques for improving delay fault diagnosis. These techniques reduce the search space for direct probing which can save a lot of time during failur...