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» Test Pattern Generation for Signal Integrity Faults on Long ...
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DAC
2006
ACM
14 years 6 months ago
Timing-based delay test for screening small delay defects
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
DAC
2006
ACM
13 years 9 months ago
Steiner network construction for timing critical nets
Conventionally, signal net routing is almost always implemented as Steiner trees. However, non-tree topology is often superior on timing performance as well as tolerance to open f...
Shiyan Hu, Qiuyang Li, Jiang Hu, Peng Li