55 search results - page 3 / 11 » Test Strategies for Low Power Devices |
DAC
2009
ACM
14 years 4 days ago
2009
ACM
In this work, we present a new optical routing framework, O-Router for future low-power on-chip optical interconnect integration utilizing silicon compatible nano-photonic devices...
DT
2006
13 years 5 months ago
2006
The ITRS (International Technology Roadmap for Semiconductors) predicts aggressive scaling down of device size, transistor threshold voltage and oxide thickness to meet growing de...
JCP
2006
13 years 5 months ago
2006
Abstract-- In this paper a novel pulse sequence testing methodology is presented [22] as an alternative to Time Domain Reflectometry (TDR) for transmission line health condition mo...
BROADNETS
2006
IEEE
13 years 11 months ago
2006
IEEE
In this paper we address three challenges that are present when building and analyzing wireless sensor networks (WSN) as part of ubiquitous computing environment: the need for an ...
GLVLSI
2008
IEEE
13 years 11 months ago
2008
IEEE
Reliability has become a practical concern in today’s VLSI design with advanced technologies. In-situ sensors have been proposed for reliability monitoring to provide advance wa...