29 search results - page 6 / 6 » Test compaction for transition faults under transparent-scan |
ATVA
2006
Springer
13 years 9 months ago
2006
Springer
Abstract. Since testing is inherently incomplete, test selection is of vital importance. Coverage measures evaluate the quality of a test suite and help the tester select test case...
DATE
2004
IEEE
13 years 9 months ago
2004
IEEE
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating...
TC
2010
13 years 3 days ago
2010
Hybrid systems have emerged as an appropriate formalism to model embedded systems as they capture the theme of continuous dynamics with discrete control. Under this paradigm, distr...
ATAL
2011
Springer
12 years 5 months ago
2011
Springer
Building on research previously reported at AAMAS conferences, this paper describes an innovative application of a novel gametheoretic approach for a national scale security deplo...