2 search results - page 1 / 1 » Test session oriented built-in self-testable data path synth... |
VLSID
2004
IEEE
14 years 5 months ago
2004
IEEE
Recent research for testable designs has focussed on inserting test structures by re-arranging an Register-TransferLevel (RTL) data path generated from a behavioural description t...
ITC
1998
IEEE
13 years 9 months ago
1998
IEEE
Existing high-level BIST synthesis methods focus on one objective, minimizing either area overhead or test time. Hence, those methods do not render exploration of large design spa...