6 search results - page 1 / 2 » Test set enrichment using a probabilistic fault model and th... |
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
— We present a probabilistic fault model that allows any number of gates in an integrated circuit to fail probabilistically. Tests for this fault model, determined using the theo...
TCAD
2008
13 years 4 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
DATE
2000
IEEE
13 years 9 months ago
2000
IEEE
Process variation has forever been the major fail cause of analog circuit where small deviations in component values cause large deviations in the measured output parameters. This...
PASTE
2010
ACM
13 years 10 months ago
2010
ACM
Recently there has been significant interest in employing probabilistic techniques for fault localization. Using dynamic dependence information for multiple passing runs, learnin...
EMSOFT
2008
Springer
13 years 6 months ago
2008
Springer
We investigate the problem of specification based testing with dense sets of inputs and outputs, in particular with imprecision as they might occur due to errors in measurements, ...