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TCAD
2008
13 years 4 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
ISQED
2002
IEEE
13 years 9 months ago
2002
IEEE
This paper presents a hybrid BIST architecture and methods for optimizing it to test systems-on-chip in a cost effective way. The proposed self-test architecture can be implemente...