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» Testing Computability by Width Two OBDDs
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APPROX
2009
Springer
137views Algorithms» more  APPROX 2009»
13 years 11 months ago
Testing Computability by Width Two OBDDs
Property testing is concerned with deciding whether an object (e.g. a graph or a function) has a certain property or is “far” (for some definition of far) from every object w...
Dana Ron, Gilad Tsur
STACS
2001
Springer
13 years 9 months ago
New Bounds on the OBDD-Size of Integer Multiplication via Universal Hashing
Abstract. Ordered binary decision diagrams (OBDDs) nowadays belong to the most common representation types for Boolean functions. Although they allow important operations such as s...
Philipp Woelfel
MFCS
1998
Springer
13 years 8 months ago
Blockwise Variable Orderings for Shared BDDs
In this paper we consider the problem of characterizing optimal variable orderings for shared OBDDs of two Boolean functions fi = gi i hi, i = 1, 2, where i is an operator from th...
Harry Preuß, Anand Srivastav
VLSID
2002
IEEE
78views VLSI» more  VLSID 2002»
14 years 5 months ago
Optimization of Test Accesses with a Combined BIST and External Test Scheme
External pins for test are precious hardware resources because this number is strongly restricted. Cores are tested via test access mechanisms (TAMs) such as a test bus architectu...
Makoto Sugihara, Hiroto Yasuura
DSD
2007
IEEE
140views Hardware» more  DSD 2007»
13 years 11 months ago
Pseudo-Random Pattern Generator Design for Column-Matching BIST
This paper discusses possibilities for a choice of a pseudorandom pattern generator that is to be used in combination with the column-matching based built-in self-test design meth...
Petr Fiser