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DFT
2002
IEEE
121views VLSI» more  DFT 2002»
13 years 10 months ago
Testing Digital Circuits with Constraints
Many digital circuits have constraints on the logic values a set of signal lines can have. In this paper, we present two new techniques for detecting the illegal combinations of l...
Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McC...
DAC
1996
ACM
13 years 9 months ago
Characterization and Parameterized Random Generation of Digital Circuits
The development of new Field-Programmed, MaskProgrammed and Laser-Programmed Gate Array architectures is hampered by the lack of realistic test circuits that exercise both the arc...
Michael D. Hutton, Jerry P. Grossman, Jonathan Ros...
CP
1998
Springer
13 years 9 months ago
Generation of Test Patterns for Differential Diagnosis of Digital Circuits
In a faulty digital circuit, many (single) faulty gates may explain the observed findings. In this paper we are mostly concerned, not in obtaining alternative diagnoses, but rathe...
Francisco Azevedo, Pedro Barahona
VTS
1999
IEEE
100views Hardware» more  VTS 1999»
13 years 9 months ago
Low-Cost On-Line Test for Digital Filters
A low-cost on-line test scheme for digital filters is proposed. The scheme uses an invariant of the digital filter, the frequency response at specific points, in order to detect p...
Ismet Bayraktaroglu, Alex Orailoglu
EH
2000
IEEE
123views Hardware» more  EH 2000»
13 years 9 months ago
The Test Vector Problem and Limitations to Evolving Digital Circuits
How do we know the correctness of an evolved circuit? While Evolutionary Hardware is exhibiting its effectiveness, we argue that it is very difficult to design a large-scale digit...
Kosuke Imamura, James A. Foster, Axel W. Krings