Power reduction during test application is important from the viewpoint of chip reliability and for obtaining correct test results. One of the ways to reduce scan test power is to...
Mohammed ElShoukry, Mohammad Tehranipoor, C. P. Ra...
Test pattern decompression techniques are bounded with the algorithm of test pattern ordering and test data flow controlling. Some of the methods could have more sophisticated sor...
We investigate the typechecking problem for XML queries: statically verifying that every answer to a query conforms to a given output schema, for inputs satisfying a given input sc...
We present a framework for property testing where a partially ordered execution trace of a distributed system is modeled by a collection of communicating automata. We prove that th...
Hesham Hallal, Sergiy Boroday, Andreas Ulrich, Ale...
Although monadic second-order logic (MSO) has been a foundation of XML queries, little work has attempted to take MSO formulae themselves as a programming construct. Indeed, MSO f...