111 search results - page 2 / 23 » Testing Input Output Partial Order Automata |
ATS
2005
IEEE
13 years 10 months ago
2005
IEEE
Power reduction during test application is important from the viewpoint of chip reliability and for obtaining correct test results. One of the ways to reduce scan test power is to...
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
Test pattern decompression techniques are bounded with the algorithm of test pattern ordering and test data flow controlling. Some of the methods could have more sophisticated sor...
ICDT
2003
ACM
13 years 10 months ago
2003
ACM
We investigate the typechecking problem for XML queries: statically verifying that every answer to a query conforms to a given output schema, for inputs satisfying a given input sc...
PTS
2003
13 years 6 months ago
2003
We present a framework for property testing where a partially ordered execution trace of a distributed system is modeled by a collection of communicating automata. We prove that th...
PLANX
2007
13 years 6 months ago
2007
Although monadic second-order logic (MSO) has been a foundation of XML queries, little work has attempted to take MSO formulae themselves as a programming construct. Indeed, MSO f...