36 search results - page 1 / 8 » Testing st -Connectivity |
DFT
2004
IEEE
13 years 8 months ago
2004
IEEE
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis. The proposed analysi...
BMCBI
2008
13 years 5 months ago
2008
Background: As in many different areas of science and technology, most important problems in bioinformatics rely on the proper development and assessment of binary classifiers. A ...
CORR
2008
Springer
13 years 5 months ago
2008
Springer
Linearity tests are randomized algorithms which have oracle access to the truth table of some function f, and are supposed to distinguish between linear functions and functions whi...
ICDT
2010
ACM
13 years 9 months ago
2010
ACM
Schema mapping composition is a fundamental operation in schema management and data exchange. The mapping composition problem has been extensively studied for a number of mapping ...