4305 search results - page 1 / 861 » The Test of Time |
VLSID
2005
IEEE
14 years 5 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
VLSID
2004
IEEE
14 years 5 months ago
2004
IEEE
FORMATS
2003
Springer
13 years 10 months ago
2003
Springer
Testing is the primary software validation technique used by industry today, but remains ad hoc, error prone, and very expensive. A promising improvement is to automatically genera...
DATE
2000
IEEE
13 years 9 months ago
2000
IEEE
In this paper, an analysis of test time by CBET (which is an acronym for Combination of BIST and External Test) test approach is presented. The analysis validates that CBET test a...
RSP
2005
IEEE
13 years 10 months ago
2005
IEEE
For cost-effective prototyping, system designers should have a clear understanding of the intended use of the prototype under development. This paper describes a classification of...