8 search results - page 1 / 2 » The deep sub-micron signal integrity challenge |
DAC
1999
ACM
14 years 5 months ago
1999
ACM
We propose a new VLSI layout methodology which addresses the main problems faced in Deep Sub-Micron (DSM) integrated circuit design. Our layout "fabric" scheme eliminate...
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
With shrinking feature size and growing integration density in the Deep Sub-Micron technologies, the global buses are fast becoming the “weakest-links” in VLSI design. They ha...
ISPD
1999
ACM
13 years 9 months ago
1999
ACM
DSD
2002
IEEE
13 years 9 months ago
2002
IEEE
Continuing VLSI technology scaling raises several deep submicron (DSM) problems like relatively slow interconnect, power dissipation and distribution, and signal integrity. Those ...
GLVLSI
2006
IEEE
13 years 11 months ago
2006
IEEE
Formal methods have been advocated for the verification of digital design where correctness is proved mathematically. In contrast to digital designs, the verification of analog ...