718 search results - page 1 / 144 » Timing Yield Calculation Using an Impulse-Train Approach |
VLSID
2002
IEEE
14 years 4 months ago
2002
IEEE
This paper presents a new method to compute the probability distribution of the delay of a combinational circuit and uses it obtain an estimate of the yield of the process that ma...
DATE
1997
IEEE
13 years 8 months ago
1997
IEEE
: In this paper, we present a new dynamic power estimation method that produces accurate power measures at considerably faster run times. The approach uses an enhanced switch-level...
ICCAD
2010
IEEE
13 years 1 months ago
2010
IEEE
Defect repair has become a necessary process to enhance the overall yield for memories since manufacturing a natural good memory is difficult in current memory technologies. This ...
PVLDB
2011
12 years 7 months ago
2011
The Hausdorff distance is commonly used as a similarity measure between two point sets. Using this measure, a set X is considered similar to Y iff every point in X is close to at ...
TCAD
2008
13 years 4 months ago
2008
Manufacturing process variations lead to variability in circuit delay and, if not accounted for, can cause excessive timing yield loss. The familiar traditional approaches to timin...