266 search results - page 2 / 54 » Timing yield estimation using statistical static timing anal... |
ICCAD
2005
IEEE
14 years 1 months ago
2005
IEEE
Based on a timing yield model, a statistical static timing analysis technique is proposed. This technique preserves existing methodology by selecting a “device file setting” ...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—We present a new technique for statistical static timing analysis (SSTA) based on Markov chain Monte Carlo (MCMC), that allows fast and accurate estimation of the right-hand tai...
ICCAD
2005
IEEE
14 years 1 months ago
2005
IEEE
— As technology scales into the sub-90nm domain, manufacturing variations become an increasingly significant portion of circuit delay. As a result, delays must be modeled as sta...
DAC
2005
ACM
14 years 5 months ago
2005
ACM
Power minimization under variability is formulated as a rigorous statistical robust optimization program with a guarantee of power and timing yields. Both power and timing metrics...
FPGA
2007
ACM
13 years 11 months ago
2007
ACM
Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...