2 search results - page 1 / 1 » Towards the logic defect diagnosis for partial-scan designs |
ASPDAC
2001
ACM
13 years 8 months ago
2001
ACM
Loical defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fails testing. In the la...
ETS
2007
IEEE
13 years 11 months ago
2007
IEEE
— A novel statistical learning algorithm is proposed to accurately analyze volume diagnosis results. This algorithm effectively overcomes the inherent ambiguities in logic diagno...