4 search results - page 1 / 1 » Trace-based microarchitecture-level diagnosis of permanent h... |
DSN
2008
IEEE
13 years 11 months ago
2008
IEEE
In the near future, hardware is expected to become increasingly vulnerable to faults due to continuously decreasing feature size. Software-level symptoms have previously been used...
DSN
2008
IEEE
13 years 11 months ago
2008
IEEE
As devices continue to scale, future shipped hardware will likely fail due to in-the-field hardware faults. As traditional redundancy-based hardware reliability solutions that ta...
MICRO
2009
IEEE
13 years 11 months ago
2009
IEEE
Continued technology scaling is resulting in systems with billions of devices. Unfortunately, these devices are prone to failures from various sources, resulting in even commodity...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
Intermittent scan chain hold-time fault is discussed in this paper and a method to diagnose the faulty site in a scan chain is proposed as well. Unlike the previous scan chain dia...