25 search results - page 5 / 5 » Transistor level gate modeling for accurate and fast timing,... |
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
EURODAC
1994
IEEE
13 years 9 months ago
1994
IEEE
synchronisation also play a fundamental role in overall system robustness. ElectroMagnetic Compatibility (EMC) and ElectroMagnetic Interference (EMI) issues also have to be conside...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
Advancing technology drives design technology and thus design automation EDA . How to model interconnect, how to handle degradation of signal integrity and increasing power densi...
FAST
2010
13 years 7 months ago
2010
An understanding of application I/O access patterns is useful in several situations. First, gaining insight into what applications are doing with their data at a semantic level he...
MOBIHOC
2006
ACM
14 years 4 months ago
2006
ACM
To date, topology control in wireless ad hoc and sensor networks--the study of how to compute from the given communication network a subgraph with certain beneficial properties--h...