With shrinking feature size and growing integration density in the Deep Sub-Micron technologies, the global buses are fast becoming the “weakest-links” in VLSI design. They ha...
Interconnect has become the dominating factor in determining circuit performance and reliability in deep submicron designs. In this embedded tutorial, we first discuss the trends...
Jason Cong, David Zhigang Pan, Lei He, Cheng-Kok K...
Interconnection networks in Systems-On-Chip begin to have a non-negligible impact on the power consumption of a whole system. This is because of increasing inter-wire capacitances...
Continuing VLSI technology scaling raises several deep submicron (DSM) problems like relatively slow interconnect, power dissipation and distribution, and signal integrity. Those ...