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» Trends of On-Chip Interconnects in Deep Sub-Micron VLSI
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ICCAD
2006
IEEE
99views Hardware» more  ICCAD 2006»
14 years 2 months ago
Information theoretic approach to address delay and reliability in long on-chip interconnects
With shrinking feature size and growing integration density in the Deep Sub-Micron technologies, the global buses are fast becoming the “weakest-links” in VLSI design. They ha...
Rohit Singhal, Gwan S. Choi, Rabi N. Mahapatra
ICCAD
1997
IEEE
86views Hardware» more  ICCAD 1997»
13 years 9 months ago
Interconnect design for deep submicron ICs
Interconnect has become the dominating factor in determining circuit performance and reliability in deep submicron designs. In this embedded tutorial, we first discuss the trends...
Jason Cong, David Zhigang Pan, Lei He, Cheng-Kok K...
VLSID
2002
IEEE
138views VLSI» more  VLSID 2002»
14 years 5 months ago
ETAM++: Extended Transition Activity Measure for Low Power Address Bus Designs
Interconnection networks in Systems-On-Chip begin to have a non-negligible impact on the power consumption of a whole system. This is because of increasing inter-wire capacitances...
Haris Lekatsas, Jörg Henkel
DSD
2002
IEEE
96views Hardware» more  DSD 2002»
13 years 10 months ago
Networks on Silicon: Blessing or Nightmare?
Continuing VLSI technology scaling raises several deep submicron (DSM) problems like relatively slow interconnect, power dissipation and distribution, and signal integrity. Those ...
Paul Wielage, Kees G. W. Goossens