19 search results - page 2 / 4 » Uniting Academic Achievements on Performance Analysis with I... |
DATE
2006
IEEE
13 years 10 months ago
2006
IEEE
Ever-increasing integrated circuit (IC) power densities and peak temperatures threaten reliability, performance, and economical cooling. To address these challenges, thermal analy...
ITC
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
ASPDAC
2009
ACM
13 years 11 months ago
2009
ACM
— As technology scales, the delay uncertainty caused by process variations has become increasingly pronounced in deep submicron designs. In the presence of process variations, wo...
BMCBI
2010
13 years 4 months ago
2010
Background: New "next generation" DNA sequencing technologies offer individual researchers the ability to rapidly generate large amounts of genome sequence data at drama...
COR
2006
13 years 4 months ago
2006
Over the last decade and a half, tabu search algorithms for machine scheduling have gained a near-mythical reputation by consistently equaling or establishing state-of-the-art per...