Sciweavers

ASPDAC   2009 Asia and South Pacific Design Automation Conference
Wall of Fame | Most Viewed ASPDAC-2009 Paper
ASPDAC
2009
ACM
262views Hardware» more  ASPDAC 2009»
13 years 11 months ago
Fault modeling and testing of retention flip-flops in low power designs
Low power circuits have become a necessary part in modern designs. Retention flip-flop is one of the most important components in low power designs. Conventional test methodologie...
Bing-Chuan Bai, Augusli Kifli, Chien-Mo James Li, ...
Disclaimer and Copyright Notice
Sciweavers respects the rights of all copyright holders and in this regard, authors are only allowed to share a link to their preprint paper on their own website. Every contribution is associated with a desciptive image. It is the sole responsibility of the authors to ensure that their posted image is not copyright infringing. This service is compliant with IEEE copyright.
IdReadViewsTitleStatus
1Download preprint from source262
2Download preprint from source255
3Download preprint from source249
4Download preprint from source212
5Download preprint from source190
6Download preprint from source184
7Download preprint from source174
8Download preprint from source171
9Download preprint from source164
10Download preprint from source164
11Download preprint from source164
12Download preprint from source161
13Download preprint from source160
14Download preprint from source159
15Download preprint from source155
16Download preprint from source153
17Download preprint from source152
18Download preprint from source152
19Download preprint from source150
20Download preprint from source145
21Download preprint from source145
22Download preprint from source144
23Download preprint from source143
24Download preprint from source142
25Download preprint from source141
26Download preprint from source141
27Download preprint from source139
28Download preprint from source137
29Download preprint from source137
30Download preprint from source135
31Download preprint from source133
32Download preprint from source132
33Download preprint from source131
34Download preprint from source130
35Download preprint from source127
36Download preprint from source127
37Download preprint from source125
38Download preprint from source124
39Download preprint from source124
40Download preprint from source122
41Download preprint from source122
42Download preprint from source120
43Download preprint from source119
44Download preprint from source118
45Download preprint from source117
46Download preprint from source117
47Download preprint from source115
48Download preprint from source115
49Download preprint from source115
50Download preprint from source115
51Download preprint from source115
52Download preprint from source114
53Download preprint from source114
54Download preprint from source113
55Download preprint from source112
56Download preprint from source111
57Download preprint from source111
58Download preprint from source110
59Download preprint from source110
60Download preprint from source109
61Download preprint from source109
62Download preprint from source108
63Download preprint from source108
64Download preprint from source108
65Download preprint from source105
66Download preprint from source105
67Download preprint from source105
68Download preprint from source104
69Download preprint from source102
70Download preprint from source102
71Download preprint from source100
72Download preprint from source100
73Download preprint from source99
74Download preprint from source98
75Download preprint from source95
76Download preprint from source92
77Download preprint from source91
78Download preprint from source91
79Download preprint from source80