Ever-increasing integrated circuit (IC) power densities and peak temperatures threaten reliability, performance, and economical cooling. To address these challenges, thermal analy...
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
— As technology scales, the delay uncertainty caused by process variations has become increasingly pronounced in deep submicron designs. In the presence of process variations, wo...
Background: New "next generation" DNA sequencing technologies offer individual researchers the ability to rapidly generate large amounts of genome sequence data at drama...
Over the last decade and a half, tabu search algorithms for machine scheduling have gained a near-mythical reputation by consistently equaling or establishing state-of-the-art per...
Jean-Paul Watson, Adele E. Howe, L. Darrell Whitle...