18 search results - page 4 / 4 » Universal Test Sets for Reversible Circuits |
ASYNC
2000
IEEE
13 years 9 months ago
2000
IEEE
Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani, Subhasish Mitra Center for Reliable Computing Stanford University Stanford, CA Jo C. Eberge...
ICCAD
1996
IEEE
13 years 9 months ago
1996
IEEE
Functional simulation is the most widely used method for design verification. At various levels of abstraction, e.g., behavioral, register-transfer level and gate level, the design...
CORR
2004
Springer
13 years 5 months ago
2004
Springer
We define the concept of dependence among multiple variables using maximum entropy techniques and introduce a graphical notation to denote the dependencies. Direct inference of in...