3 search results - page 1 / 1 » Use ECP, not ECC, for hard failures in resistive memories |
ISCA
2010
IEEE
13 years 8 months ago
2010
IEEE
As leakage and other charge storage limitations begin to impair the scalability of DRAM, non-volatile resistive memories are being developed as a potential replacement. Unfortunat...
EMSOFT
2009
Springer
13 years 11 months ago
2009
Springer
While NAND flash memories have rapidly increased in both capacity and performance and are increasingly used as a storage device in many embedded systems, their reliability has de...
CODES
2009
IEEE
13 years 11 months ago
2009
IEEE
Since flash memory has many attractive characteristics such as high performance, non-volatility, low power consumption and shock resistance, it has been widely used as storage med...