19 search results - page 3 / 4 » Using Negative Correlation to Evolve Fault-Tolerant Circuits |
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
IJCNN
2008
IEEE
13 years 12 months ago
2008
IEEE
— Negative Correlation Learning (NCL) has been showing to outperform other ensemble learning approaches in off-line mode. A key point to the success of NCL is that the learning o...
GECCO
2006
Springer
13 years 9 months ago
2006
Springer
In this paper, a genetic algorithm (GA) is used to design faulttolerant analog controllers for a piezoelectric micro-robot. Firstorder and second-order functions are developed to ...
FPGA
2009
ACM
14 years 10 days ago
2009
ACM
Aggressive scaling increases the number of devices we can integrate per square millimeter but makes it increasingly difficult to guarantee that each device fabricated has the inte...
DAC
2001
ACM
14 years 6 months ago
2001
ACM
This paper presents the design and evaluation of an 8-bit adiabatic multiplier. Both the multiplier core and its built-in self-test logic have been designed using a true single-ph...