165 search results - page 1 / 33 » Variability and yield improvement: rules, models, and charac... |
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
Yield and variability are becoming detractors for successful design in sub-90-nm process technologies. We consider the fundamental lithography and process issues that are driving ...
ICCAD
2005
IEEE
14 years 1 months ago
2005
IEEE
— Variability in the chip design process has been relatively increasing with technology scaling to smaller dimensions. Using worst case analysis for circuit optimization severely...
ISCI
2011
12 years 12 months ago
2011
We present a general rule induction algorithm based on sequential covering, suitable for variable consistency rough set approaches. This algorithm, called VC-DomLEM, can be used f...
FPGA
2007
ACM
13 years 11 months ago
2007
ACM
Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...
RECOMB
2007
Springer
14 years 5 months ago
2007
Springer
Most tandem mass spectrum identification algorithms use information only from the final spectrum, ignoring precursor information such as peptide retention time (RT). Efforts to exp...