3 search results - page 1 / 1 » Variability-Driven Buffer Insertion Considering Correlations |
ICCD
2005
IEEE
13 years 10 months ago
2005
IEEE
— In this work we investigate the buffer insertion problem under process variations. Sub 100-nm fabrication process causes significant variations on many design parameters. We p...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
A comprehensive probabilistic methodology is proposed to solve the buffer insertion problem with the consideration of process variations. In contrast to a recent work, we point o...
ISPD
2006
ACM
13 years 10 months ago
2006
ACM
Advanced process technologies call for a proactive consideration of process variations in design to ensure high parametric timing yield. Despite of its popular use in almost any h...