46 search results - page 2 / 10 » Variational capacitance modeling using orthogonal polynomial... |
ICCD
2006
IEEE
14 years 1 months ago
2006
IEEE
— As the technology scales into 90nm and below, process-induced variations become more pronounced. In this paper, we propose an efficient stochastic method for analyzing the vol...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
In this paper, we investigate the impact of interconnect and device process variations on voltage fluctuations in power grids. We consider random variations in the power grid’s...
ASPDAC
2008
ACM
13 years 6 months ago
2008
ACM
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
DAC
2006
ACM
14 years 5 months ago
2006
ACM
For statistical timing and power analysis that are very important problems in the sub-100nm technologies, stochastic analysis of power grids that characterizes the voltage fluctua...
ISBI
2004
IEEE
14 years 5 months ago
2004
IEEE
Ultrasound images are corrupted by a multiplicative noise, the speckle, which makes high level analysis difficult. Within each resolution cell a number of elementary scatterers re...