—With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits...
Shrikanth Ganapathy, Ramon Canal, Antonio Gonz&aac...
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
Ever-increasing integrated circuit (IC) power densities and peak temperatures threaten reliability, performance, and economical cooling. To address these challenges, thermal analy...
Design space exploration of embedded systems typically focuses on classical design goals such as cost, timing, buffer sizes, and power consumption. Robustness criteria, i.e. sensi...