3 search results - page 1 / 1 » X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data |
VTS
2006
IEEE
13 years 10 months ago
2006
IEEE
A statistical technique X-IDDQ for extracting defect information from IDDQ data is presented that is effective for detection of defects in ICs. The technique treats the IDDQ measu...
ITC
1997
IEEE
13 years 9 months ago
1997
IEEE
Capacitive Leadframe testing is an effective approach for detecting faults in printed circuit boards. Capacitance measurements, however, are affected by mechanical variations duri...
FASE
2009
Springer
13 years 8 months ago
2009
Springer
Abstract. API error-handling specifications are often not documented, necessitating automated specification mining. Automated mining of error-handling specifications is challenging...