7 search results - page 1 / 2 » Yield Improvement and Repair Trade-Off for Large Embedded Me... |
DATE
2000
IEEE
13 years 9 months ago
2000
IEEE
In this paper, we give an overview of the trade-off to improve yield and optimize silicon manufacturing cost. The specific technology focus is on large embedded memories in comple...
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
In modern SoCs, embedded memories occupy the largest part of the chip area and include an even larger amount of active devices. As memories are designed very tightly to the limits...
ETS
2007
IEEE
13 years 11 months ago
2007
IEEE
An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. Therefore embedded memories are commonly equipped with spare r...
MICRO
2009
IEEE
13 years 11 months ago
2009
IEEE
Voltage scaling is one of the most effective mechanisms to reduce microprocessor power consumption. However, the increased severity of manufacturing-induced parameter variations a...
MICRO
2007
IEEE
13 years 11 months ago
2007
IEEE
In deep sub-micron ICs, growing amounts of ondie memory and scaling effects make embedded memories increasingly vulnerable to reliability and yield problems. As scaling progresses...