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ADC
2009
Springer
13 years 11 months ago
2009
Springer
Comparative evaluations of information retrieval systems are based on a number of key premises, including that representative topic sets can be created, that suitable relevance ju...
MICCAI
2008
Springer
14 years 6 months ago
2008
Springer
In this paper we study the impact of denoising the raw high angular resolution diffusion imaging (HARDI) data with the Non-Local Means filter adapted to Rician noise (NLMr). We fir...
ISCAS
2008
IEEE
13 years 11 months ago
2008
IEEE
—We present experimental results from an integrated circuit designed for wireless neural recording applications. The chip, which was fabricated in a 0.6-µm 2P3M BiCMOS process, ...
ISCAS
2008
IEEE
13 years 11 months ago
2008
IEEE
— An overview of digital enhancement techniques for analog circuits is presented. Recent research suggests that the high density and low energy of digital circuits can be leverag...
EVOW
2008
Springer
13 years 6 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...