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ATS
1996
IEEE
13 years 9 months ago
1996
IEEE
A hierarchical test generation method is presented that uses the inherent hierarchical structure of the circuit under test and takes fault diagnosability into account right from t...
ATS
1996
IEEE
13 years 9 months ago
1996
IEEE
In this paper, we present a novel and efticient approach to test MCM at the module as well as chip levels. Our design incorporates the concept of the multifrequency test method an...
CCCG
1996
13 years 6 months ago
1996
In computational metrology one needs to compute whether an object satis es speci cations of shape within an acceptable tolerance. To this end positions on the object are measured,...