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ATS   1996 Asian Test Symposium
Wall of Fame | Most Viewed ATS-1996 Paper
ATS
1996
IEEE
117views Hardware» more  ATS 1996»
13 years 8 months ago
Hierarchical Test Generation with Built-In Fault Diagnosis
A hierarchical test generation method is presented that uses the inherent hierarchical structure of the circuit under test and takes fault diagnosability into account right from t...
Dirk Stroobandt, Jan Van Campenhout
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